Unlike transmission electron microscopes (TEM), the device is dedicated solely to Electron Diffraction (ED, also known as microED or tomography), enabling it to outperform TEM in diffraction. With a disruptive horizontal design and an innovative probe-handling mechanism, the dedicated Electron Diffractometer will help crystallographers enter the field of nano-crystallography and produce important structural information faster, with better quality and at lower cost.
A detailed cost comparison overview will offer insights in regards to the unbeatable cost advantages of a dedicated electron diffractometer over X-ray and TEM-based approaches.